Researchers
Stojadinović, Ninoslav
Type
Date issued
Results 41-60 of 81
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2012 | Lifetime estimation in nbt-stressed p-channel power VDMOSFETS | Danković, Danijel   ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 53M53 |
| 2012 | A method for negative bias temperature instability (NBTI) measurements on power VDMOS transistors | Prijić, Aneta ; Danković, Danijel ; Vračar, Ljubomir ; Manić, Ivica ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 21M21 |
| 2012 | 28th International Conference on Microelectronics Sponsored by SSCS-Serbia/Montenegro Chapters in May: Over 100 Converge from 22 Countries; Nearly 100 Papers [Chapters] | Stojadinović, Ninoslav ; Danković, Danijel | Article | Mp. category will be shown later |
| 2011 | Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2011 | Hf-doped Ta2O5 stacks under constant voltage stress | Manić, Ivica ; Atanassova, E.; Stojadinović, Ninoslav ; Spassov, D.; Paskaleva, A. | Article | 21M21 |
| 2011 | NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions | Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Article | 22M22 |
| 2010 | Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress | Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran | Article | 22M22 |
| 2010 | Instabilities in p-channel power VDMOSFETs subjected to pulsed negative bias temperature stressing | Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana | Conference Paper | Mp. category will be shown later |
| 2010 | Degradation of p-channel power VDMOSFETs under pulsed NBT stress | Đorić-Veljković, Snežana ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2010 | Effects of Constant Voltage Stress in Hf-doped Ta2O5 Stacks | Manić, Ivica ; Elena Atanassova; Stojadinović, Ninoslav ; Dencho Spassov | Conference Paper | Mp. category will be shown later |
| 2010 | Constant Voltage Stressing of Hf-Doped Ta2O5 Stacks | Manić, Ivica ; Stojadinović, Ninoslav ; Elena Atanassova; Dencho Spassov | Conference Paper | Mp. category will be shown later |
| 2010 | Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress | Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Prijić, Aneta ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2009 | Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs | Manić, Ivica ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs | Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | Constant voltage stress induced current in Ta2O5 stacks and its dependence on a gate electrode | Atanassova, E; Stojadinović, Ninoslav D ; Paskaleva, A; Spassov, D; Vračar, Ljubomir M ; Georgieva, M | Article | 21aM21a |
| 2008 | Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors | Davidović, Vojkan ; Stojadinović, Ninoslav ; Danković, Danijel ; Golubović, Snežana ; Manić, Ivica ; Đorić Veljković, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2008 | Negative bias temperature instability in n-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2007 | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs | Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana | Conference Paper | Mp. category will be shown later |
| 2007 | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |