Researchers
Stojadinović, Ninoslav
Type
Date issued
Results 61-80 of 81
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2006 | Lifetime estimation in NBT stressed P-channel power VDMOSFETs![]() | Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2006 | Electrical stressing effects in commercial power VDMOSFETs![]() | Stojadinović, Ninoslav | Article | 22M22 |
| 2006 | NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs![]() | Danković, Danijel | Article | 22M22 |
| 2006 | Spontaneous recovery in DC gate bias stressed power VDMOSFETs![]() | Manić, Ivica | Conference Paper | Mp. category will be shown later |
| 2005 | Effects of electrical stressing in power VDMOSFETS![]() | Stojadinović, Ninoslav | Article | 22M22 |
| 2005 | Computer as powerful tool in reliability testing of thin gate dielectrics in MOS devices![]() | Vračar, Ljubomir | Conference Paper | Mp. category will be shown later |
| 2005 | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs![]() | Stojadinović, Ninoslav | Article | 22M22 |
| 2003 | Stress-induced leakage currents in thin silicon dioxide films![]() | Pesić, Biljana | Article | 22M22 |
| 2003 | Effects of electrical stressing in power VDMOSFETs![]() | Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2003 | Computer controlled equipment for laboratory exercises in physics and electronics![]() | Vračar, Ljubomir | Conference Paper | Mp. category will be shown later |
| 2002 | Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs![]() | Stojadinović, Ninoslav | Article | 22M22 |
| 2002 | Spontaneous recovery of positive gate bias stressed power VDMOSFETs![]() | Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2001 | Analytical modelling of electrical characteristics in gamma-irradiated power VDMOS transistors![]() | Manić, Ivica | Article | 22M22 |
| 1998 | A new technology computer-aided design (TCAD) system based on neural network models![]() | Pantić, Dragan | Article | 22M22 |
| 1996 | Charge-pumping characterization of SiO/sub 2//Si interface in virgin and irradiated power VDMOSFETs![]() | Habaš, Predrag | Article | Mp. category will be shown later |
| 1995 | Effect of radiation-induced oxide-trapped charge on mobility in p-channel MOSFETs![]() | Stojadinović, Ninoslav | Article | Mp. category will be shown later |
| 1995 | Inverse modeling of semiconductor manufacturing processes by neural networks![]() | Pantić, Dragan | Conference Paper | Mp. category will be shown later |
| 1994 | An efficient multiparticle diffusion simulation by an adaptive multigrid method![]() | Pantić, Dragan | Article | Mp. category will be shown later |
| 1992 | The efficient simulation of point diffusion by an adaptive multigrid method![]() | Pantić, Dragan | Article | Mp. category will be shown later |
| 1991 | MUSIC — A MULTIGRID SIMULATOR FOR IC FABRICATION PROCESSES![]() | Miljković, Slobodan; Pantić, Dragan | Article | Mp. category will be shown later |
