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Browsing by Author Đorić-Veljković, Snežana
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| Issue Date | Title | Author(s) | Type | М-cat. |
|---|---|---|---|---|
| 2024 | A Reliability Investigation of VDMOS Transistors: Performance and Degradation Caused by Bias Temperature Stress (✓) | Živanović, Emilija   ; Veljković, Sandra ; Mitrović, Nikola ; Jovanović, Igor ; Đorić Veljković, Snežana ; Paskaleva, Albena; Spassov, Dencho; Danković, Danijel | Article | 22M22 |
| 2018 | A review of pulsed NBTI in P-channel power VDMOSFETs (✓) | Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Prijić, Zoran ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, A.; Spassov, D.; Stojadinović, Ninoslav | Article | 22M22 |
| 2021 | A Review of the Electric Circuits for NBTI Modeling in p-Channel Power VDMOSFETs (✓) | Danković, Danijel ; Mitrović, Nikola ; Veljkovic, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Paskaleva, Albena; Spassov, Dentcho; Golubović, Snežana | Conference Paper | Mp. category will be shown later |
| 1995 | Analysis of gamma-irradiation induced degradation mechanisms in power VDMOSFETS (✓) | Stojadinović, N.; Golubović, S.; Đorić, S. ; Dimitrijev, S. | Article | Mp. category will be shown later |
| 1995 | Analysis of gamma-irradiation induced oxide charge and interface trap effects in power VDMOSFETs (✓) | Đoric-Veljkovic, S. ; Davidovic, V. | Conference Paper | Mp. category will be shown later |
| 2015 | Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET (✓) | Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana | Article | 22M22 |
| 2023 | Analysis of the light emission processes in oled devices Materials (✓) | Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Vučković, Dragan ; Stevanović, Jelena ; Janković, Predrag ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2015 | Analytical application of the reaction system alizarine-hydrogen peroxide in borate buffer media for the spectrophotometric kinetic determination of Ni(II) (✓) | Rančić, Sofija ; Mandić, Snežana ; Bojić, Aleksandar ; Đorić-Veljković, Snežana ; Zarubica, Aleksandra ; Jankovic, Predrag | Article | 52M52 |
| 2015 | Annealing influence on recovery of electrically stressed power vertical double-diffused metal oxide semiconductor transistors (✓) | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 23M23 |
| 2011 | Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs (✓) | Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2017 | Application of the reaction system methylene blue B - (NH4)2S2O8 for the kinetic spectrophotometric determination of palladium in citric buffer media (✓) | Rančić, Sofija ; Nikolic-Mandic, Snezana ; Bojić, Aleksandar ; Đorić-Veljković, Snežana ; Zarubica, Aleksandra ; Janković, Predrag | Article | 23M23 |
| 2023 | Approach to some aspects of electrokinetic soil treatment (✓) | Đorić-Veljković, Snežana ; Bonić, Zoran ; Zlatanović, Elefterija ; Marinković, Nemanja ; Stojanović-Krasić, Marija ; Romić, Nikola ; Đorđević, Dragan | Conference Paper | Mp. category will be shown later |
| 2011 | Challanges and Possibilities of Application of OLED Light Sources (✓) | Đorić-Veljković, Snežana ; Karamarković, Jugoslav | Conference Paper | Mp. category will be shown later |
| 2022 | Characterization of irradiated and NBT stressed p-channel power VDMOSFETs (✓) | Mitrović, Nikola ; Veljković, Sandra ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Živanović, Emilija ; Prijić, Zoran ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2011 | Comparative analysis of thermal characteristics of wooden and built family houses (✓) | Marković, Nemanja B. ; Stojković, Nenad V. ; Đorić-Veljković, Snežana M. | Conference Paper | Mp. category will be shown later |
| 2010 | Degradation of p-channel power VDMOSFETs under pulsed NBT stress (✓) | Đorić-Veljković, Snežana ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2021 | Efekti zračenja i odžarivanja kod naponsko temperaturno naprezanih p-kanalnih VDMOS tranzistora snage (✓) | Veljković, Sandra ; Mitrović, Nikola ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Danković, Danijel | Conference Paper | Mp. category will be shown later |
| 2023 | Effects in Commercial p-Channel Power VDMOS Transistors Initiated by Negative Bias Temperature Stress and Irradiation (✓) | Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Živanović, Emilija ; Stanković, Srboljub ; Anđelković, Marko ; Ristić, Goran ; Paskleva, Albena;
Spassov, Dentcho; Danković, Danijel
; | Conference Paper | Mp. category will be shown later |
| 2021 | Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors (✓) | Veljković, Sandra ; Mitrović, Nikola ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana ; Paskaleva, Albena; Spassov, Dentcho; Prijić, Zoran ; Prijić, Aneta ;
Stanković, S.
; Danković, Danijel ; | Conference Paper | Mp. category will be shown later |
| 2003 | Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (✓) | Đoric-Veljkovic, Snezana M ; Đoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Article | 22M22 |