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Browsing by Author Golubovic, Snezana M

Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)TypeМp-cat.
2004Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETsDjoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana M; Stojadinovic, Ninoslav DConference Paper
Mp. category will be shown later
2003Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETsĐoric-Veljkovic, Snezana M  ; Đoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav DArticle
22M22
2002Effects of burn-in stressing on radiation response of power VDMOSFETsStojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M  ; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana MArticle
22M22
2001Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETsStojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana MConference Paper
Mp. category will be shown later
2002Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETsStojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M  ; Davidović, Vojkan  ; Golubovic, Snezana M; Dimitrijev, SimaArticle
22M22
2002Effects of positive gate bias stress on radiation response in power VDMOSFETsStojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana MConference Paper
Mp. category will be shown later
2001Gamma-irradiation effects in power MOSFETs for application in communication satellitesStojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S  ; Manic, Ivica Dj; Golubovic, Snezana MConference Paper
Mp. category will be shown later
2001Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETsStojadinovic, Ninoslav D; Manic, Ivica Dj  ; Đoric-Veljkovic, Snezana M  ; Davidovic, Vojkan S  ; Golubovic, Snezana M; Dimitrijev, SimaArticle
22M22
2001Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors (Erratum - errors in Authors - vol 38, pg 4699, 1999)</strong></font>Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S  Other
Mp. category will be shown later
2000Radiation effects in low-temperature stressed power VDMOS transistorsDjoric-Veljkovic, Snezana M; Davidovic, Vojkan S  ; Golubovic, Snezana M; Stojadinovic, Ninoslav DConference Paper
Mp. category will be shown later
2002Radiation hardening of power MOSFETs using electrical stressStojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M  ; Manic, Ivica Dj; Davidovic, Vojkan S  ; Golubovic, Snezana MArticle
21M21