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Browsing by Author Golubovic, Snezana M
Showing results 1 to 11 of 11
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2004 | Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs | Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S   ; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Conference Paper | Mp. category will be shown later |
| 2003 | Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs | Đoric-Veljkovic, Snezana M ; Đoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Article | 22M22 |
| 2002 | Effects of burn-in stressing on radiation response of power VDMOSFETs | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Научни чланак | 22M22 - Међународни часопис категорије M22 |
| 2001 | Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Конференцијски рад | Мп категорија ће бити приказана накнадно. |
| 2002 | Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M ; Davidović, Vojkan ; Golubovic, Snezana M; Dimitrijev, Sima | Научни чланак | 22M22 - Међународни часопис категорије M22 |
| 2002 | Effects of positive gate bias stress on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Конференцијски рад | Мп категорија ће бити приказана накнадно. |
| 2001 | Gamma-irradiation effects in power MOSFETs for application in communication satellites | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S ; Manic, Ivica Dj; Golubovic, Snezana M | Конференцијски рад | Мп категорија ће бити приказана накнадно. |
| 2001 | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs | Stojadinovic, Ninoslav D; Manic, Ivica Dj ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima | Naučni članak | 22M22 - Međunarodni časopis kategorije M22 |
| 2001 | Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors | Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S | Ostalo | Mp kategorija će biti prikazana naknadno. |
| 2000 | Radiation effects in low-temperature stressed power VDMOS transistors | Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S ; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2002 | Radiation hardening of power MOSFETs using electrical stress | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Naučni članak | 21M21 - Vodeći međunarodni časopis kategorije M21 |