Davidović, Vojkan

Type

Date issued

107 2000 - 2027
1 1900 - 1999

Mp-cat.

54 М30/М60
30 M22
7 M20/M50
6 M21
3 M24
2 M23
1 M10/M40
1 M21a
1 M51
1 M53
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Results 61-80 of 108 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2015	Analysis of recoverable and permanent components of threshold voltage shift in NBT stressed p-channel power VDMOSFET	Danković, Danijel ; Stojadinović, Ninoslav ; Prijić, Zoran ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana	Article	22M22
2015	Negative bias temperature instability in p-channel power VDMOSFETs: recoverable versus permanent degradation	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Stojadinović, Ninoslav ; Prijić, Zoran ; Golubović, Snežana	Article	21M21
2014	Mobilna eksperimentalna postavka za određivanje napona praga VDMOS tranzistora snage	Aleksandar Ilić; Prijić, Zoran ; Prijić, Aneta ; Davidović, Vojkan ; Danković, Danijel ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2014	Negative Bias Temperature Instability in Thick Gate Oxides for Power MOS Transistors	Stojadinović, Ninoslav ; Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Prijić, Aneta ; Golubović, Snežana ; Prijić, Zoran	Book parts	Mp. category will be shown later
2014	Recovery Treatment Effects on Gamma Radiation Response in Electrically Stressed Power VDMOS Transistors	Đorić-Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Manić, Ivica ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2014	Modeliranje i PSPICE simulacija NBTI efekata kod VDMOS tranzistora	Marjanović, Miloš B. ; Danković, Danijel ; Prijić, Aneta ; Prijić, Zoran ; Davidović, Vojkan ; Janković, Nebojša D.	Conference Paper	Mp. category will be shown later
2013	Effects of static and pulsed negative bias temperature stressing on lifetime in p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	23M23
2013	Uticaj odžarivanja na oporavak električno naprezanih p-kanalnih VDMOS tranzistora snage	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2013	The Comparison of Gamma-Radiation and Electrical Stress Influences on Oxide and Interface Defects in Power Vdmosfet	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2012	Lifetime estimation in nbt-stressed p-channel power VDMOSFETS	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	53M53
2012	Određivanje perioda pouzdanog rada p-kanalnih VDMOS tranzistora snage podvrgnutih kontinualnim i impulsnim NBT naprezanjima	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana	Conference Paper	Mp. category will be shown later
2011	NBTI related degradation and lifetime estimation in p-channel power VDMOSFETs under the static and pulsed NBT stress conditions	Manić, Ivica ; Danković, Danijel ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	22M22
2011	Annealing of radiation-induced defects in burn-in stressed power VDMOSFETs	Đorić-Veljković, Snežana ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2010	Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress	Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Prijić, Aneta ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2010	Degradation of p-channel power VDMOSFETs under pulsed NBT stress	Đorić-Veljković, Snežana ; Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2010	Threshold voltage instabilities in p-channel power VDMOSFETs under pulsed NBT stress	Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran	Article	22M22
2010	Instabilities in p-channel power VDMOSFETs subjected to pulsed negative bias temperature stressing	Danković, Danijel ; Prijić, Aneta ; Manić, Ivica ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav ; Đorić-Veljković, Snežana	Conference Paper	Mp. category will be shown later
2009	Analiza tehnika za razdvajanje efekata naelektrisanja u oksidu gejta i površinskih stanja kod VDMOS tranzistora snage	Davidović, Vojkan	Doctoral theses	70M70
2009	Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs	Manić, Ivica ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2008	Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs	Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22