Researchers
Đorić-Veljković, Snežana
Results 121-133 of 133
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2002 | Spontaneous recovery of positive gate bias stressed power VDMOSFETs | Stojadinović, Ninoslav  ; Manić, Ivica  ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima | Conference Paper | Mp. category will be shown later |
| 2002 | Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M ; Davidović, Vojkan ; Golubovic, Snezana M; Dimitrijev, Sima | Article | 22M22 |
| 2002 | Effects of burn-in stressing on radiation response of power VDMOSFETs | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Article | 22M22 |
| 2002 | Radiation hardening of power MOSFETs using electrical stress | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Article | 21M21 |
| 2002 | Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2001 | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs | Stojadinovic, Ninoslav D; Manic, Ivica Dj ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima | Article | 22M22 |
| 1999 | Power VDMOS transistors response to lowered temperature conditions | Đoric-Veljkovic, S. ; Golubovic, S.; Davidovic, V.; Stojadinovic, N. | Conference Paper | Mp. category will be shown later |
| 1999 | Modeling of γ-Irradiation and Lowered Temperature Effects in Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors | Golubovic, Snezana; Đoric-Veljkovic, Snezana ; Davidovic, V.; Stojadinovic, Ninoslav | Article | 21M21 |
| 1998 | Modeling Radiation-Induced Mobility Degradation in MOSFETs | Stojadinović, N.; Golubović, S.; Davidović, V.; Đorić-Veljković, S. ; Dimitrijev, S. | Article | 22M22 |
| 1997 | Modeling of radiation-induced mobility degradation in MOSFETs | Stojadinovic, N.; Golubovic, S.; Davidovic, V.; Đoric-Veljkovic, S. ; Dimitrijev, S. | Conference Paper | Mp. category will be shown later |
| 1995 | Analysis of gamma-irradiation induced degradation mechanisms in power VDMOSFETS | Stojadinović, N.; Golubović, S.; Đorić, S. ; Dimitrijev, S. | Article | Mp. category will be shown later |
| 1995 | Analysis of gamma-irradiation induced oxide charge and interface trap effects in power VDMOSFETs | Đoric-Veljkovic, S. ; Davidovic, V. | Conference Paper | Mp. category will be shown later |
| 1994 | Separation of irradiation induced gate oxide charge and interface traps effects in power VDMOSFETs | Stojadinović, N.; Đorić, S. ; Davidović, V.; Golubović, S. | Article | 21M21 |