Stojadinović, Ninoslav

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Results 1-20 of 81 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2020	Modelovanje promena napona praga p-kanalnih VDMOS tranzistora snage tokom NBT naprezanja	Mitrović, Nikola ; Danković, Danijel ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2020	Modeling of NBTI degradation in p-channel VDMOSFETs	Mitrović, Nikola ; Danković, Danijel ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	24+M24+
2020	Modeling of NBTS Effects in P-Channel Power VDMOSFETs	Danković, Danijel ; Mitrović, Nikola ; Prijić, Zoran ; Stojadinović, Ninoslav D.	Article	22M22
2020	Modeling of Static Negative Bias Temperature Stressing in p-channel VDMOSFETs using Least Square Method	Mitrović, Nikola ; Ranđelović, Branislav ; Danković, Danijel ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	23M23
2019	Procedure merenja električnih karakteristika naprezanih p-kanalnih VDMOS tranzistora snage	Đorić-Veljković, Snežana M. ; Davidović, Vojkan S. ; Danković, Danijel M. ; Golubović, Snežana M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2019	Impact of γ Radiation on Charge Trapping Properties of Nanolaminated HfO2/Al2O3 ALD Stacks	Spassov, Dentcho; Paskaleva, Albena; Davidović, Vojkan S. ; Đorić-Veljković, Snežana M. ; Stanković, Srboljub J. ; Stojadinović, Ninoslav D. ; Ivanov, Tzvetan E.; Stanchev, T.	Conference Paper	Mp. category will be shown later
2019	Modelling of δv_{t</sub> in NBT stressed P-channel power VDMOSFETS}	Mitrović, Nikola ; Danković, Danijel ; Prijić, Zoran ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2018	NBTI and irradiation related degradation mechanisms in power VDMOS transistors	Stojadinović, Ninoslav ; Đorić-Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stanković, Srboljub ; Prijić, Aneta ; Prijić, Zoran ; Manić, Ivica ; Danković, Danijel	Article	22M22
2018	Effects of consecutive irradiation and bias temperature stress in p-channel power vertical double-diffused metal oxide semiconductor transistors	Davidović, Vojkan ; Danković, Danijel ; Ilić, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav	Article	22M22
2018	A review of pulsed NBTI in P-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Prijić, Aneta ; Davidović, Vojkan ; Prijić, Zoran ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Paskaleva, A.; Spassov, D.; Stojadinović, Ninoslav	Article	22M22
2018	Elektrohemijski procesi kod p-kanalnih VDMOS tranzistora snage pri sukcesivnom NBT naprezanju i ozračivanju	Davidović, Vojkan S. ; Danković, Danijel M. ; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Ivica Manić ; Prijić, Zoran D. ; Prijić, Aneta P. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2018	NBT stress and radiation related degradation and underlying mechanisms in power VDMOSFETs	Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Đorić Veljković, Snežana ; Manić, Ivica ; Prijić, Zoran ; Prijić, Aneta ; Stojadinović, Ninoslav ; Stankovic, Srboljub	Article	24M24
2017	Modelling of Threshold Voltage Shift in Pulsed NBT Stressed P-Channel Power VDMOSFETs	Danković, Danijel M. ; Manić, Ivica Đ. ; Stojadinović, Ninoslav D. ; Prijić, Zoran D. ; Đorić-Veljković, Snežana M. ; Davidović, Vojkan S. ; Prijić, Aneta P. ; A. Paskaleva; D. Spassov; Golubović, Snežana B.	Conference Paper	Mp. category will be shown later
2017	Electrical and Charge Trapping Properties of HfO2/Al2O3 Multilayer Dielectric Stacks	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2017	Ispitivanje višeslojnih HfO2/Al2O3 struktura za memorijske komponente	Davidović, Vojkan S. ; A. Paskaleva; D. Spassov; E. Guziewicz; T. Krajewski; Golubović, Snežana M. ; Đorić-Veljković, Snežana M. ; Manić, Ivica Đ. ; Danković, Danijel M. ; Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2017	NBTI and Radiation Related Degradation and Lifetime Estimation in Power VDMOSFETs	Stojadinović, Ninoslav D.	Conference Paper	Mp. category will be shown later
2016	Effects of pulsed negative bias temperature stressing in p-channel power VDMOSFETs	Manić, Ivica ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Đorić-Veljković, Snežana ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	24M24
2016	MODELING AND PSPICE SIMULATION OF RADIATION STRESS INFLUENCE ON THRESHOLD VOLTAGE SHIFTS IN P-CHANNEL POWER VDMOS TRANSISTORS	Marjanović, Miloš ; Danković, Danijel ; Davidović, Vojkan ; Prijić, Aneta ; Stojadinović, Ninoslav ; Prijić, Zoran ; Janković, Nebojša	Article	Mp. category will be shown later
2016	On the Recoverable and Permanent Components of NBTI in p-Channel Power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Prijić, Aneta ; Marjanović, Miloš ; Ilic, Aleksandar; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21
2016	NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors	Davidović, Vojkan ; Danković, Danijel ; Ilic, Aleksandar; Manić, Ivica ; Golubović, Snežana ; Đorić-Veljković, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav	Article	21M21