Researchers
Golubović, Snežana
Results 41-60 of 71
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2008 | Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors | Davidović, Vojkan   ; Stojadinović, Ninoslav ; Danković, Danijel ; Golubović, Snežana ; Manić, Ivica ; Đorić Veljković, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2008 | Negative bias temperature instability in n-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2008 | Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs | Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2007 | Библиографија радова проф. др Нинослава Стојадиновића | Голубовић, Снежана | Other | Mp. category will be shown later |
| 2007 | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs | Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana | Conference Paper | Mp. category will be shown later |
| 2007 | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2006 | Spontaneous recovery in DC gate bias stressed power VDMOSFETs | Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2006 | Efekti naprezanja oksida gejta VDMOS tranzistora snage | Golubović, Snežana ; Đorić-Veljković, Snežana ; Manić, Ivica ; Давидовић, Војкан | Monograph | Mp. category will be shown later |
| 2006 | NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2006 | Electrical stressing effects in commercial power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2006 | Lifetime estimation in NBT stressed P-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2005 | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs | Stojadinović, Ninoslav ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana | Article | 22M22 |
| 2005 | Effects of electrical stressing in power VDMOSFETS | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2003 | Effects of electrical stressing in power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Conference Paper | Mp. category will be shown later |
| 2002 | Spontaneous recovery of positive gate bias stressed power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima | Conference Paper | Mp. category will be shown later |
| 2002 | Mechanisms of spontaneous recovery in positive gate bias stressed power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 1995 | Sensitivity and fading of pMOS dosimeters with thick gate oxide | Ristić, Goran ; Golubović, Snežana ; Pejović, Momčilo | Article | Mp. category will be shown later |
| 1995 | Analiza formiranja i odžarivanja radijacionih defekata kod MOS tranzistora | Golubović, Snežana | Doctoral theses | 70M70 |
| 1995 | Temperature-induced rebound in Al-gate NMOS transistors | Pejović, Momčilo ; Golubović, Snežana ; Ristić, Goran | Article | Mp. category will be shown later |