Researchers
Đorić-Veljković, Snežana
Results 101-120 of 133
| Issue Date | Title | Author(s) | Type | Мp-cat. |
|---|---|---|---|---|
| 2010 | Puasonov potok događaja kao model za prolazak vozila kroz presek puta | Petrović, Miloš; Đorić-Veljković, Snežana   ; Karamarković, Jugoslav | Article | 52M52 |
| 2010 | Negative Bias Temperature Instability in p-Channel Power VDMOSFETs Under Pulsed Bias Stress | Manić, Ivica ; Danković, Danijel ; Đorić-Veljković, Snežana ; Prijić, Aneta ; Davidović, Vojkan ; Golubović, Snežana ; Prijić, Zoran ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2009 | Effects of low gate bias annealing in NBT stressed p-channel power VDMOSFETs | Manić, Ivica ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | Negative bias temperature stress and annealing effects in p-channel power VDMOSFETs | Dankovic, D.; Manic, I.; Davidovic, V.; Đoric-Veljkovic, S. ; Golubovic, S.; Stojadinovic, N. | Conference Paper | Mp. category will be shown later |
| 2008 | Mechanisms of spontaneous recovery in DC gate bias stressed power VDMOSFETs | Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | Negative bias temperature instability in n-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2008 | New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2008 | Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors | Davidović, Vojkan ; Stojadinović, Ninoslav ; Danković, Danijel ; Golubović, Snežana ; Manić, Ivica ; Đorić Veljković, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2007 | Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2007 | Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs | Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana | Conference Paper | Mp. category will be shown later |
| 2006 | Lifetime estimation in NBT stressed P-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2006 | Spontaneous recovery in DC gate bias stressed power VDMOSFETs | Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav | Conference Paper | Mp. category will be shown later |
| 2006 | Electrical stressing effects in commercial power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2006 | Efekti naprezanja oksida gejta VDMOS tranzistora snage | Golubović, Snežana ; Đorić-Veljković, Snežana ; Manić, Ivica ; Давидовић, Војкан | Monograph | Mp. category will be shown later |
| 2006 | NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs | Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav | Article | 22M22 |
| 2005 | Negative bias temperature instability mechanisms in p-channel power VDMOSFETs | Stojadinović, Ninoslav ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana | Article | 22M22 |
| 2005 | Effects of electrical stressing in power VDMOSFETS | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Article | 22M22 |
| 2003 | Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs | Đoric-Veljkovic, Snezana M ; Đoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Article | 22M22 |
| 2003 | Effects of electrical stressing in power VDMOSFETs | Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima | Conference Paper | Mp. category will be shown later |
| 2002 | Radiation hardening of power MOSFETs using electrical stress | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M | Article | 21M21 |