eNauka - pregled
Pregled prema Autor Stojadinovic, Ninoslav D
Prikaz rezultata 1 do 17 od 17
| Godina | Naslov | Autor(i) | Tip rezultata | Mp-kat. |
|---|---|---|---|---|
| 2004 | An improved analytical model of IGBT in forward conduction mode | Pavlovic, Zoran; Manic, Ivica Dj; Stojadinovic, Ninoslav D | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2004 | Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs | Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2008 | Degradation behavior of Ta2O5 stacks and its dependence on the gate electrode | Atanassova, E; Stojadinovic, Ninoslav D; Paskaleva, A | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2003 | Effects of burn-in stressing on post-irradiation annealing response of power VDMOSFETs (✓) | Đoric-Veljkovic, Snezana M   ; Đoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2002 | Effects of burn-in stressing on radiation response of power VDMOSFETs (✓) | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S; Golubovic, Snezana M | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2001 | Effects of elevated-temperature bias stressing on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S; Golubovic, Snezana M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2002 | Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs (✓) | Stojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M ; Davidović, Vojkan; Golubovic, Snezana M; Dimitrijev, Sima | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2004 | Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors | Kouvatsos, DN; Davidovic, Vojkan S; Papaioannou, GJ; Stojadinovic, Ninoslav D; Michalas, L; Exarchos, M; Voutsas, AT; Goustouridis, D | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2002 | Effects of positive gate bias stress on radiation response in power VDMOSFETs | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S; Golubovic, Snezana M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2001 | Gamma-irradiation effects in power MOSFETs for application in communication satellites | Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Manic, Ivica Dj; Golubovic, Snezana M | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2007 | Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors | Davidovic, Vojkan S; Kouvatsos, DN; Stojadinovic, Ninoslav D; Voutsas, AT | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2001 | Mechanisms of positive gate bias stress induced instabilities in power VDMOSFETs (✓) | Stojadinovic, Ninoslav D; Manic, Ivica Dj ; Đoric-Veljkovic, Snezana M ; Davidovic, Vojkan S ; Golubovic, Snezana M; Dimitrijev, Sima | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2001 | Modeling of gamma-irradiation and lowered temperature effects in power vertical double-diffused metal-oxide-semiconductor transistors | Stojadinovic, Ninoslav D; Golubovic, Snezana M; Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S | Ostalo | Mp kategorija će biti prikazana naknadno. |
| 2000 | Papers presented at the 22nd International Conference on Microelectronics (MIEL) 14-17 May 2000, Nis, Yugoslavia | Stojadinovic, Ninoslav D | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2001 | Progress in power semiconductors | Charitat, G; Benda, V; Stojadinovic, Ninoslav D | Naučni članak | 22M22 - Rad u istaknutom međ. časopisu |
| 2000 | Radiation effects in low-temperature stressed power VDMOS transistors | Djoric-Veljkovic, Snezana M; Davidovic, Vojkan S; Golubovic, Snezana M; Stojadinovic, Ninoslav D | Konferencijski rad | Mp kategorija će biti prikazana naknadno. |
| 2002 | Radiation hardening of power MOSFETs using electrical stress (✓) | Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S; Golubovic, Snezana M | Naučni članak | 21M21 - Rad u vrhunskom međ. časopisu |