Davidović, Vojkan

Type

Date issued

107 2000 - 2027
1 1900 - 1999

Mp-cat.

54 М30/М60
30 M22
7 M20/M50
6 M21
3 M24
2 M23
1 M10/M40
1 M21a
1 M51
1 M53
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Results 81-100 of 108 Results/Page

Issue Date	Title	Author(s)	Type	Мp-cat.
2008	Negative bias temperature instability in n-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2008	New approach in estimating the lifetime in NBT stressed p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2008	Turn-Around of Threshold Voltage in Gate Bias Stressed p-Channel Power Vertical Double-Diffused Metal-Oxide-Semiconductor Transistors	Davidović, Vojkan ; Stojadinović, Ninoslav ; Danković, Danijel ; Golubović, Snežana ; Manić, Ivica ; Đorić Veljković, Snežana ; Dimitrijev, Sima	Article	22M22
2007	Impact of negative bias temperature instabilities on lifetime in p-channel power VDMOSFETs	Stojadinović, Ninoslav ; Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana	Conference Paper	Mp. category will be shown later
2007	Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors	Davidovic, Vojkan S ; Kouvatsos, DN; Stojadinovic, Ninoslav D; Voutsas, AT	Article	22M22
2007	Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Davidović, Vojkan ; Đorić Veljković, Snežana ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2006	NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav	Article	22M22
2006	Spontaneous recovery in DC gate bias stressed power VDMOSFETs	Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2006	Electrical stressing effects in commercial power VDMOSFETs	Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima	Article	22M22
2006	Lifetime estimation in NBT stressed P-channel power VDMOSFETs	Danković, Danijel ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Golubović, Snežana ; Stojadinović, Ninoslav	Conference Paper	Mp. category will be shown later
2005	Negative bias temperature instability mechanisms in p-channel power VDMOSFETs	Stojadinović, Ninoslav ; Danković, Danijel ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Manić, Ivica ; Golubović, Snežana	Article	22M22
2005	Effects of electrical stressing in power VDMOSFETS	Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima	Article	22M22
2004	Burn-in stressing effects on post-irradiation annealing response of power VDMOSFETs	Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M; Stojadinovic, Ninoslav D	Conference Paper	Mp. category will be shown later
2004	Effects of hot carrier and irradiation stresses on advanced excimer laser annealed polycrystalline silicon thin film transistors	Kouvatsos, DN; Davidovic, Vojkan S ; Papaioannou, GJ; Stojadinovic, Ninoslav D; Michalas, L; Exarchos, M; Voutsas, AT; Goustouridis, D	Article	22M22
2003	Effects of electrical stressing in power VDMOSFETs	Stojadinović, Ninoslav ; Manić, Ivica ; Davidović, Vojkan ; Danković, Danijel ; Đorić Veljković, Snežana ; Golubović, Snežana ; Dimitrijev, Sima	Conference Paper	Mp. category will be shown later
2002	Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs	Stojadinovic, Ninoslav D; Manic, Ivica Dj; Đoric-Veljkovic, Snezana M ; Davidović, Vojkan ; Golubovic, Snezana M; Dimitrijev, Sima	Article	22M22
2002	Spontaneous recovery of positive gate bias stressed power VDMOSFETs	Stojadinović, Ninoslav ; Manić, Ivica ; Đorić Veljković, Snežana ; Davidović, Vojkan ; Danković, Danijel ; Golubović, Snežana ; Dimitrijev, Sima	Conference Paper	Mp. category will be shown later
2002	Effects of burn-in stressing on radiation response of power VDMOSFETs	Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M	Article	22M22
2002	Radiation hardening of power MOSFETs using electrical stress	Stojadinovic, Ninoslav D; Đoric-Veljkovic, Snezana M ; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M	Article	21M21
2002	Effects of positive gate bias stress on radiation response in power VDMOSFETs	Stojadinovic, Ninoslav D; Djoric-Veljkovic, Snezana M; Manic, Ivica Dj; Davidovic, Vojkan S ; Golubovic, Snezana M	Conference Paper	Mp. category will be shown later